Does Placement Affect SEU Sensitivity of SRAM-based FPGAs?
نویسندگان
چکیده
The paper investigates the influence of the placement on the SEU sensitivity of designs implemented in SRAM-based FPGAs. The experimental evaluation of an FFT sample design has been accomplished by the FLIPPER and STAR tools.
منابع مشابه
Reliability-Aware Placement and Routing for FPGAs
Soft errors are intermittent malfunctions of hardware that are not reproducible. They may affect the data integrity and affect the system operation. These errors are growing reliability threat in VLSI system design. A soft error occurring in a memory cell or register is called a Single Event Upset (SEU). Designs mapped into Field Programmable Gate Arrays (FGPAs) are more vulnerable to soft erro...
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SRAM-based Field Programmable Gate Arrays (FPGAs) are an attractive solution for many applications where short time-to-market, low-cost for low-production volumes, and in-the-field-programming ability are important issues. One of the few major disadvantages of SRAM-based FPGAs is the sensitivity to ionizing radiation [1-3]. Indeed, also at sea level, neutrons, originating from the interactions ...
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